Use the form below to find the searched projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”.
Pajisje gjysëmpërçuese - Pajisje diskrete - Pjesa 4: Dioda dhe tranzistorë me mikrovalë
60.60 Standard published
Amendament 1 - Pajisje gjysmëpërçuese - Pajisje diskrete - Pjesa 4: Dioda dhe tranzistorë me mikrovalë
60.60 Standard published
Pajisje gjysëmpërçuese - Pajisje diskrete - Pjesa 7: Tranzistorë bipolar
60.60 Standard published
Pajisje gjysëmpërçuese - Pajisje diskrete - Pjesa 8: Tranzistorë me efekt fushe
60.60 Standard published
Pajisje gjysëmpërçuese - Pajisje diskrete - Pjesa 9: Tranzistorët bipolar me porta të izoluara (IGBT)
60.60 Standard published
Amendamenti 1 – Pajisje gjysmëpërçuese - Pajisjet diskrete - Pjesa 8: Transistorët me efekt në terren
60.60 Standard published
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
60.60 Standard published
Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
60.60 Standard published
Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
60.60 Standard published
Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
60.60 Standard published
Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
60.60 Standard published
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
60.60 Standard published
Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
60.60 Standard published
Semiconductor devices - Hot carrier test on MOS transistors
60.60 Standard published
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
60.60 Standard published
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
60.60 Standard published
English