Use the form below to find the searched projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”.
Visual comfort of display terminals - Part 1: Introduction
40.99 Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
50.00 Final text received or FDIS registered for formal approval
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
40.00 DIS registered
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
40.60 Close of voting
Quantum Interconnect – Part 1: Introduction and roadmap for standardization
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
High-level test description table for development of production test programs
50.00 Final text received or FDIS registered for formal approval
High-level test description table for development of production test programs - General Principles
50.00 Final text received or FDIS registered for formal approval
Rotating electrical machines for the traction of road vehicles
30.99 CD approved for registration as DIS
Nuclear power plants - Instrumentation, control and electrical power systems - System software vulnerability and system software end-of-support management
50.60 Close of voting. Proof returned by secretariat
Design principles and validation methods for the maintenance of microbial control for non-disposable fluid paths of dialysis equipment
20.99 WD approved for registration as CD
Prosumer plugs and prosumer inlets for household and similar purposes - Part 1: General requirements –
20.99 WD approved for registration as CD
Prosumer plugs and prosumer inlets for household and similar purposes - Part 2: Standard sheets and gauges
20.99 WD approved for registration as CD
Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects
40.60 Close of voting
LOW-VOLTAGE FUSES: Product data and properties for information exchange
20.99 WD approved for registration as CD
Reference Guidance for Energy Service Business Using Thermal Energy Storage System
30.60 Close of voting/ comment period
English