DPS
Drejtoria e Përgjithshme e Standardizimit
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
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Amendment 1 - Passive RF and microwave devices, intermodulation level measurement - Part 4: Measurement of passive intermodulation in coaxial cables

50.99 FDIS or proof approved for publication

TC 46 more

Amendment 1 - Passive RF and microwave devices, intermodulation level measurement - Part 6: Measurement of passive intermodulation in antennas

50.99 FDIS or proof approved for publication

TC 46 more

Passive RF and microwave devices, intermodulation level measurement - Part 7: Field measurements of passive intermodulation

30.60 Close of voting/ comment period

TC 46 more

Uninterruptible power systems (UPS) - Part 1: Safety requirements

40.00 DIS registered

TC 22/SC 22H more

Uninterruptible power systems (UPS) - Part 5-1: DC output UPS - Safety requirements

20.99 WD approved for registration as CD

TC 22/SC 22H more

Amendment 1 - Uninterruptible power systems (UPS) - Part 5-3: DC output UPS - Performance and test requirements

20.99 WD approved for registration as CD

TC 22/SC 22H more

Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level

20.99 WD approved for registration as CD

TC 51 more

Safety of machinery - Application of protective equipment to detect the presence of persons

40.99 Full report circulated: DIS approved for registration as FDIS

TC 44 more

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

40.99 Full report circulated: DIS approved for registration as FDIS

TC 47/SC 47F more

Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers

40.99 Full report circulated: DIS approved for registration as FDIS

TC 47/SC 47F more

Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

30.99 CD approved for registration as DIS

TC 47/SC 47F more

Semiconductor Devices - Micro-electromechanical Devices - Part 52: Biaxial tensile testing method for stretchable MEMS

40.20 DIS ballot initiated: 12 weeks

TC 47/SC 47F more

Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device

50.00 Final text received or FDIS registered for formal approval

TC 47/SC 47F more

Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile

20.99 WD approved for registration as CD

TC 47/SC 47F more

Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

20.99 WD approved for registration as CD

TC 47/SC 47F more

Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

20.99 WD approved for registration as CD

TC 47/SC 47F more

Electricity metering equipment - General requirements, tests and test conditions - Part 11: Metering equipment

30.60 Close of voting/ comment period

TC 13 more

Accuracy test method for static electricity meters under dynamic load conditions

20.99 WD approved for registration as CD

TC 13 more