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IEC 62047-56 ED1

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

General information

50.60     Oct 2, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

Scope

IEC 62047-56 ED1 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-56 ED1
50.60 Close of voting. Proof returned by secretariat
Oct 2, 2026