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IEC 62047-56 ED1

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

General information

Current stage: 40.20 Effective date: Feb 13, 2026

Next stage: PRVC Next stage date: May 8, 2026

Originator: IEC

Owner: TC 47/SC 47F

Type: International Standard

ICS: 31.080.99

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-56 ED1
40.20 DIS ballot initiated: 12 weeks
Feb 13, 2026

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