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IEC 62047-56:2026 ED1

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

Oct 28, 2026

General information

60.60     Oct 28, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

English  

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IEC 62047-56:2026 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

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PUBLISHED
IEC 62047-56:2026 ED1
60.60 Standard published
Oct 28, 2026