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IEC 62047-56 ED1

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

General information

40.99     12 qer 2026

DECFDIS    10 korr 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-56 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
12 qer 2026