Use the form below to find the searched projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”.
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
60.60 Standard published
International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
60.60 Standard published
Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
60.60 Standard published
Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
60.60 Standard published
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
60.60 Standard published
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
60.60 Standard published
Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
60.60 Standard published
Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
60.60 Standard published
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
60.60 Standard published
Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
60.60 Standard published
Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
60.60 Standard published
Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
60.60 Standard published
Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
60.60 Standard published
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
60.60 Standard published
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
60.60 Standard published
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
60.60 Standard published
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
60.60 Standard published
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
60.60 Standard published
Shqip