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Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
30.60 Close of voting/ comment period
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
40.00 DIS registered
Quantum Interconnect – Part 1: Introduction and roadmap for standardization
50.00 Final text received or FDIS registered for formal approval
High-level test description table for development of production test programs
40.99 Full report circulated: DIS approved for registration as FDIS
Guideline of High-Level Test Description Table for Development of Production Test Programs
50.00 Final text received or FDIS registered for formal approval
Rotating electrical machines for the traction of road vehicles
30.20 CD study/ballot initiated
Technical requirements for electrical sheet metal and strip metal used in rotating electrical machines
60.00 Standard under publication
Nuclear power plants - Instrumentation, control and electrical power systems - System software vulnerability and system software end-of-support management
50.00 Final text received or FDIS registered for formal approval
Design principles and validation methods for the maintenance of microbial control for non-disposable fluid paths of dialysis equipment
20.99 WD approved for registration as CD
Prosumer plugs and prosumer inlets for household and similar purposes - Part 2: Standard sheets and gauges
20.99 WD approved for registration as CD
Measuring equipment for electrical and electromagnetic quantities - Environmental aspects
50.00 Final text received or FDIS registered for formal approval
Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects
40.60 Close of voting
LOW-VOLTAGE FUSES: Product data and properties for information exchange
20.99 WD approved for registration as CD
Open Charge Point Protocol 2.01 Ed4 (Fast track)
40.20 DIS ballot initiated: 12 weeks
Open Charge Point Protocol 2.1 Ed2 (fast track)
40.20 DIS ballot initiated: 12 weeks
Interpretation of Dissolved Gas Analysis (DGA) in natural and synthetic esters
50.00 Final text received or FDIS registered for formal approval
English