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IEC 63492-1 ED1

Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

General information

30.60     25 pri 2025

IEC

TC 47

International Standard

31.080.01  

Scope

Life cycle

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IN_DEVELOPMENT
IEC 63492-1 ED1
30.60 Close of voting/ comment period
25 pri 2025