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IEC 63492-1 ED1

Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

General information

30.20     31 jan 2025

PCC    25 pri 2025

IEC

TC 47

International Standard

31.080.01  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63492-1 ED1
30.20 CD study/ballot initiated
31 jan 2025

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