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IEC 63492-1 ED1

Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

General information

Current stage: 30.20 Effective date: Jan 31, 2025

Next stage: PCC Next stage date: Apr 25, 2025

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Life cycle

NOW

IN_DEVELOPMENT
IEC 63492-1 ED1
30.20 CD study/ballot initiated
Jan 31, 2025

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