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Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ
20.99 WD approved for registration as CD
Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
50.00 Final text received or FDIS registered for formal approval
Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors
30.20 CD study/ballot initiated
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
30.60 Close of voting/ comment period
Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array
30.99 CD approved for registration as DIS
Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
60.00 Standard under publication
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
50.99 FDIS or proof approved for publication
Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
30.99 CD approved for registration as DIS
Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
20.99 WD approved for registration as CD
Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
20.99 WD approved for registration as CD
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
40.60 Close of voting
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
40.60 Close of voting
Nuclear facilities - Electrical equipment important to safety - Qualification
40.60 Close of voting
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
40.60 Close of voting
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