IEC 60747-14-12 ED1

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

General information

Current stage: 50.20 Effective date: 28 gush 2026

Next stage: PRVD Next stage date: 9 tet 2026

Originator: IEC

Owner: TC 47/SC 47E

Type: International Standard

ICS: 31.080.01

Scope

IEC 60747-14-12 ED1 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-14-12 ED1
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
28 gush 2026

Preview

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