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IEC 60747-14-12 ED1

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

General information

40.99     31 tet 2025

DECFDIS    27 shk 2026

IEC

TC 47/SC 47E

International Standard

31.080.01  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-14-12 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
31 tet 2025