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IEC 60747-14-12 ED1

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

General information

50.00     19 dhj 2025

CFDIS    13 mar 2026

IEC

TC 47/SC 47E

International Standard

31.080.01  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-14-12 ED1
50.00 Final text received or FDIS registered for formal approval
19 dhj 2025