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IEC 60749-29 ED3

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

General information

30.99     28 tet 2025

TCDV    31 tet 2025

IEC

TC 47

International Standard

31.080.01  

Scope

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-29:2011 ED2

NOW

IN_DEVELOPMENT
IEC 60749-29 ED3
30.99 CD approved for registration as DIS
28 tet 2025