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IEC 60749-29 ED3

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

General information

40.00     Dec 12, 2025

CCDV    Jan 30, 2026

IEC

TC 47

International Standard

31.080.01  

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-29:2011 ED2

NOW

IN_DEVELOPMENT
IEC 60749-29 ED3
40.00 DIS registered
Dec 12, 2025