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IEC 60749-29:2011 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
7 pri 2011

General information

60.60     7 pri 2011

IEC

TC 47

International Standard

31.080.01  

anglisht   frëngjisht  

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Scope

IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-29:2003 ED1

NOW

PUBLISHED
IEC 60749-29:2011 ED2
60.60 Standard published
7 pri 2011