IEC 60749-29:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Publication date: 4 nën 2003

General information

Current stage: 99.60 Effective date: 7 pri 2011

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht spanjisht

Buying

Statusi: Revised

PDF - 17 526 Lekë

Paper - 17 526 Lekë

CD - 17 526 Lekë

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Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62181:2000 ED1

NOW

WITHDRAWN
IEC 60749-29:2003 ED1
99.60 Withdrawal effective
7 pri 2011

REVISED BY

PUBLISHED
IEC 60749-29:2011 ED2