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IEC 60749-29:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Nov 4, 2003

General information

99.60     Apr 7, 2011

IEC

TC 47

International Standard

31.080.01  

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Revised

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Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62181:2000 ED1

NOW

WITHDRAWN
IEC 60749-29:2003 ED1
99.60 Withdrawal effective
Apr 7, 2011

REVISED BY

PUBLISHED
IEC 60749-29:2011 ED2