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62607-2-7: Nanomanufacturing - Key control characteristics - Part 2-7: Single wall carbon nanotubes - Semiconducting/metallic-ratio: Optical spectroscopy
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 3-1: Luminescent nanomaterials - Quantum efficiency
30.99 CD approved for registration as DIS
IEC TS 62607-3-4 Nanomanufacturing - Key control characteristics - Part 3-4: Nanophotonic products - Luminance of quantum dot enabled light emitting diodes: configuration optimized measurement for top and bottom devices
20.99 WD approved for registration as CD
IEC TS 62607-3-5 Nanomanufacturing - Key control characteristics - Part 3-5: Nanophotonic products - Light conversion efficiency of quantum dot enabled light conversion films: luminance meter
30.20 CD study/ballot initiated
62607-4-15: Nanomanufacturing - Key control characteristics - Part 4-15: Nano-enabled energy storage - Electrical resistivity of carbon black for the electrodes of electrochemical devices: 4-electrods method
20.99 WD approved for registration as CD
Nanomanufacturing - key control characteristics - Part 4-XX: Carbon nanomaterials for electric double layer capacitors (EDLC) - Electrochemical key control characteristics: Coin type EDLC method - Test methods for coin type EDLC
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristic - Part 4-11: Nano-enabled energy storage – Dispersion stability of nano-carbon materials for the electrodes of electrochemical capacitors: zeta potential method
30.60 Close of voting/ comment period
IEC TS 62607-4-9 ED 1: Nanomanufacturing - Key control characteristics - Part 4-9: Carbon nanomaterials for electric double layer capacitors (EDLC) - Electrochemical key control characteristics: Coin type EDLC method - Preparation of coin type EDLC
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 6-23: Graphene films – Carrier mobility and sheet resistance: Hall Measurement
30.60 Close of voting/ comment period
Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products – Number of layer distribution of graphene films: Optical contrast method
30.20 CD study/ballot initiated
Nanomanufacturing - key control characteriastics - Part 6-26: 2D materials - Fracture stain and stress, Young’s modulus, residual strain and stress: Bulge test
40.99 Full report circulated: DIS approved for registration as FDIS
IEC TS 62607-6-27 Nanomanufacturing - Key control characteristics-– Part 6-27: Graphene-related products - Field-effect mobility: 4-Point Probe Field-Effect Transistor method
50.00 Final text received or FDIS registered for formal approval
IEC TS 62607-6-28 Nanomanufacturing - Key control characteristics - Part 6-28: Graphene-related products - Number of layers: Raman spectroscopy
50.00 Final text received or FDIS registered for formal approval
Nanomanufacturing - Key control characteristics - Part 6-29: Graphene-based materials - Defectiveness: Raman spectroscopy
30.60 Close of voting/ comment period
Nanomanufacturing - Key control characteristic - Part 6-31: Graphene in powder form - Specific surface area: Brunauer-Emmett-Teller method
20.99 WD approved for registration as CD
Nanomanufacturing – Key control characteristics – Part 6-32: Two-dimensional materials – Charge carrier mobility, contact resistance, sheet resistance, doping, and hysteresis: Gated transfer length method
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 6-33: Graphene-related products - Defect density of graphene: electron energy loss spectroscopy
30.20 CD study/ballot initiated
Nanomanufacturing - key control characteristics – Part 6-34: Reduced graphene oxide - Reduction degree: Raman spectroscopy
20.99 WD approved for registration as CD
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