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IEC 60747-5-18 ED1

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

General information

40.99     28 nën 2025

DECFDIS    20 shk 2026

IEC

TC 47/SC 47E

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-5-18 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
28 nën 2025