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Semiconductor devices - Part 14-14: Semiconductor Sensors - Semiconductor Magnetic Current Sensors for Basic and Reinforced Insulation
20.99 WD approved for registration as CD
Semiconductor devices - Part 14-16: Semiconductor sensors - Performance test method for capacitive fingerprint sensors
20.99 WD approved for registration as CD
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
30.60 Close of voting/ comment period
Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array
40.00 DIS registered
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
50.99 FDIS or proof approved for publication
Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
40.00 DIS registered
Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
30.60 Close of voting/ comment period
Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
30.20 CD study/ballot initiated
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
30.99 CD approved for registration as DIS
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
40.60 Close of voting
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
40.60 Close of voting
Nuclear facilities - Electrical equipment important to safety - Qualification
40.60 Close of voting
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
30.20 CD study/ballot initiated
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
30.20 CD study/ballot initiated
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
40.60 Close of voting
Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay
20.99 WD approved for registration as CD
Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests
40.60 Close of voting
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