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Amendment 1 - Household electrical appliances - Performance - Water for testing
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-1: Blank detail specification - Current limiting application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-2: Blank detail specification - Heating element application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ
20.99 WD approved for registration as CD
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ
20.99 WD approved for registration as CD
Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
60.00 Standard under publication
Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors
30.60 Close of voting/ comment period
Semiconductor devices - Part 14-14: Semiconductor Sensors - Semiconductor Magnetic Current Sensors for Basic and Reinforced Insulation
20.99 WD approved for registration as CD
Semiconductor devices - Part 14-16: Semiconductor sensors - Performance test method for capacitive fingerprint sensors
20.99 WD approved for registration as CD
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
30.60 Close of voting/ comment period
Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
60.00 Standard under publication
Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
40.20 DIS ballot initiated: 12 weeks
Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
30.60 Close of voting/ comment period
Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
30.60 Close of voting/ comment period
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
30.99 CD approved for registration as DIS
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
40.60 Close of voting
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
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