ISO 16700:2004

Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Publication date: 5 mar 2004

95.99 Withdrawal of Standard 18 korr 2016

General information

Current stage: 95.99 Effective date: 18 korr 2016

Originator: ISO

Owner: ISO/TC 202/SC 4

Type: International Standard

ICS: 37.020

Gjuha: anglisht

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Statusi: Shfuqizuar

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Scope

ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.

Life cycle

NOW

WITHDRAWN
ISO 16700:2004
95.99 Withdrawal of Standard
18 korr 2016

REVISED BY

PUBLISHED
ISO 16700:2016

National adoptions

SSH ISO 16700:2004

DPS

Analiza mikrobiale - Mikroskop elektronik skanimi - Udhëzues për zmadhim e imazhit të kalibruar

60.60 Standard published

DPS/KT 233 më tepër