Publikuar
ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.
Revises
ISO 16700:2004
PUBLISHED
ISO 16700:2016
90.93
Standard confirmed
23 nën 2023
IN_DEVELOPMENT
ISO/PWI 16700
Analiza e mikrorrezes - Mikroskopi elektronik skanues - Udhëzime për kalibrimin e zmadhimit të imazhit
60.60 Standard published
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