SSH ISO 16700:2004

Analiza mikrobiale - Mikroskop elektronik skanimi - Udhëzues për zmadhim e imazhit të kalibruar

Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Publication date: 16 nën 2016

General information

Current stage: 60.60 Effective date: 12 korr 2016

Originator: DPS

Owner: DPS/KT 233

Type: International Standard

ICS: 37.020

Gjuha: anglisht

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Statusi: Publikuar

PDF - 2 915 Lekë

Paper - 2 915 Lekë

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PDF and Paper - 5 830 Lekë

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ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.

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PUBLISHED
SSH ISO 16700:2004
60.60 Standard published
12 korr 2016

REVISED BY

PUBLISHED
SSH ISO 16700:2016

SSH ISO 16700:2004

Analiza mikrobiale - Mikroskop elektronik skanimi - Udhëzues për zmadhim e imazhit të kalibruar

Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

General information

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Scope

Life cycle

NOW

REVISED BY

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Adopted from ISO 16700:2004