ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
WITHDRAWN
ISO 16700:2004
95.99
Withdrawal of Standard
Jul 18, 2016
PUBLISHED
ISO 16700:2016
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
60.60 Standard published
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