DPS
Drejtoria e Përgjithshme e Standardizimit
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
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Projects

Use the form below to find the searched projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”.

Secondary cells and batteries containing alkaline or other non-acid electrolytes - Safety requirements for secondary lithium batteries for use in road vehicles not for the propulsion

60.60 Standard published

TC 21/SC 21A more

Switchgear and controlgear and their assemblies for low voltage - Environmental aspects

60.60 Standard published

TC 121 more

Electric energy supply networks - General aspects and methods for the maintenance of installations and equipment

60.60 Standard published

TC 8 more

Adjusted volume calculation for refrigerating appliances

60.60 Standard published

TC 59/SC 59M more

Graphical symbols for diagrams - Guidance on design for standardization in IEC 60617

60.60 Standard published

TC 3 more

Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station

60.60 Standard published

TC 115 more

Amendment 1 - Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station

60.60 Standard published

TC 115 more

Low-voltage docking connectors for removable energy storage units

60.60 Standard published

TC 23/SC 23H more

Electrical installations for lighting and beaconing of aerodromes - Connecting devices - General requirements and tests

60.60 Standard published

TC 97 more

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects

60.60 Standard published

TC 47 more

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection

60.60 Standard published

TC 47 more

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

60.60 Standard published

TC 47 more

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

60.60 Standard published

TC 47 more

Industrial-process measurement, control and automation - Framework for functional safety and security

60.60 Standard published

TC 65 more

Ultrasonics - Field characterization - Infrared imaging techniques for determining temperature elevation in tissue-mimicking material and at the radiation surface of a transducer in still air

60.60 Standard published

TC 87 more

Power supplying scheme for wearable system and equipment

60.60 Standard published

TC 100 more

Photonic integrated circuits - Part 1: Introduction and roadmap for standardization

60.60 Standard published

TC 86/SC 86C more

Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1: Cardiac SPECT

60.60 Standard published

TC 62/SC 62C more