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IEC TR 63133:2017 ED1

Semiconductor devices - Scan based ageing level estimation for semiconductor devices
11 tet 2017

General information

60.60     11 tet 2017

IEC

TC 47

Technical Report

31.080.01  

anglisht  

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Scope

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Life cycle

NOW

PUBLISHED
IEC TR 63133:2017 ED1
60.60 Standard published
11 tet 2017

National adoptions

DS IEC TR 63133:2017 ED1:2021  
DPS

Pajisje gjysmëpërçuese - Skanimi bazuar në vlerësimin e nivelit të vjetrimit për pajisjet gjysmëpërçuese

60.60 Standard published

DPS/KT 7 më tepër