Publikuar
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
PUBLISHED
IEC TR 63133:2017 ED1
60.60
Standard published
11 tet 2017
Pajisje gjysmëpërçuese - Skanimi bazuar në vlerësimin e nivelit të vjetrimit për pajisjet gjysmëpërçuese
60.60 Standard published
Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.