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IEC TR 63133:2017 ED1

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Oct 11, 2017

General information

60.60     Oct 11, 2017

IEC

TC 47

Technical Report

31.080.01  

English  

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Scope

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

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PUBLISHED
IEC TR 63133:2017 ED1
60.60 Standard published
Oct 11, 2017

National adoptions

DS IEC TR 63133:2017 ED1:2021  
DPS

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

60.60 Standard published

DPS/KT 7 more