IEC TR 63133:2017 ED1

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Publication date: Oct 11, 2017

General information

Current stage: 60.60 Effective date: Oct 11, 2017

Originator: IEC

Owner: TC 47

Type: Technical Report

ICS: 31.080.01

Languages: English

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Status: Published

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Scope

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Life cycle

NOW

PUBLISHED
IEC TR 63133:2017 ED1
60.60 Standard published
Oct 11, 2017

National adoptions

DS IEC TR 63133:2017 ED1:2021

DPS

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

60.60 Standard published

DPS/KT 7 more

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