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DS IEC TR 63133:2017 ED1:2021

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Jun 23, 2022

General information

60.60     Jun 23, 2022

95.99   

DPS

DPS/KT 7

Technical Report

31.080.01  

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Scope

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

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PUBLISHED
DS IEC TR 63133:2017 ED1:2021
60.60 Standard published
Jun 23, 2022

Related project

Adopted from IEC TR 63133:2017 ED1