DPS
Drejtoria e Përgjithshme e Standardizimit
Tel/Cel: +355 4 222 62 55
E-mail: info@dps.gov.al
Adresa: Rr.: "Reshit Collaku", (pranë ILDKPKI, kati VI), Kutia Postare 98, Tiranë - Shqipëri
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Projects

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Switching device for islanding (SDFI)

40.60 Close of voting

TC 23/SC 23K më tepër

Fully flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements

40.60 Close of voting

TC 34/SC 34A më tepër

LED lamps – Safety requirements

40.20 DIS ballot initiated: 12 weeks

TC 34/SC 34A më tepër

LED Light sources – Performance requirements

40.99 Full report circulated: DIS approved for registration as FDIS

TC 34/SC 34A më tepër

Coupled-stress acceleration test sequence for photovoltaic modules and materials

40.99 Full report circulated: DIS approved for registration as FDIS

TC 82 më tepër

Concentric lay overhead electrical stranded conductors

30.60 Close of voting/ comment period

TC 7 më tepër

Excimer sources for germicidal purpose - Safety specifications

30.20 CD study/ballot initiated

TC 34 më tepër

Measurement of ozone production from UV-C radiation sources and luminaires

20.99 WD approved for registration as CD

TC 34 më tepër

Germicidal equipment - Low-pressure mercury UV radiation sources for germicidal purpose - Safety specifications

30.99 CD approved for registration as DIS

TC 34 më tepër

Electrical safety of Snow melting photovoltaic (Snow PV) module - Requirements for construction and testing

40.99 Full report circulated: DIS approved for registration as FDIS

TC 82 më tepër

Visual comfort of display terminals - Part 1: Introduction

40.99 Full report circulated: DIS approved for registration as FDIS

TC 100/TA 1 më tepër

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle

30.99 CD approved for registration as DIS

TC 47 më tepër

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light

30.20 CD study/ballot initiated

TC 47 më tepër

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process

30.60 Close of voting/ comment period

TC 47 më tepër

Quantum Interconnect – Part 1: Introduction and roadmap for standardization

30.60 Close of voting/ comment period

TC 86 më tepër

High-level test description table for development of production test programs

40.60 Close of voting

TC 91 më tepër

Rotating electrical machines for the traction of road vehicles

30.60 Close of voting/ comment period

PC 131 më tepër

Evaluation of absorbed power density related to human exposure to radio frequency fields from wireless communication devices operating between 6 GHz and 300 GHz

50.60 Close of voting. Proof returned by secretariat

TC 106 më tepër