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Overhead lines - Aviation warning spheres - Layout and installation guide
40.99 Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
30.60 Close of voting/ comment period
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
20.99 WD approved for registration as CD
Quantum Interconnect – Part 1: Introduction and roadmap for standardization
30.60 Close of voting/ comment period
High-level test description table for development of production test programs
30.20 CD study/ballot initiated
Rotating electrical machines for the traction of road vehicles
20.99 WD approved for registration as CD
Estimation Method for Lifetime Conversion from “PART” to “SYSTEM”
50.00 Final text received or FDIS registered for formal approval
Evaluation of Absorbed Power Density Related to Human Exposure to Radio Frequency Fields from Wireless Communication Devices Operating between 6 GHz and 300 GHz.
30.60 Close of voting/ comment period
Internet of Things (IoT) — Multi-modal underwater wireless communication technologies — Part 1: Overview and requirements
20.99 WD approved for registration as CD
Nuclear Power Plants - Instrumentation, control and electrical power systems of nuclear facilities - System software vulnerability and end-of-support system software management
20.99 WD approved for registration as CD
Performance of power electronic reactive power shunt compensators in high voltage alternating current (HVAC) systems
30.60 Close of voting/ comment period
Evaluation methods for protection against risk of fire in electric tumble dryers
50.00 Final text received or FDIS registered for formal approval
Design principles and validation methods for the maintenance of microbial control for non-disposable fluid paths of dialysis equipment
20.99 WD approved for registration as CD
Measuring equipment for electrical and electromagnetic quantities - Environmental aspects
20.99 WD approved for registration as CD
Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers - Part 1: Classification of defects
30.60 Close of voting/ comment period
LOW-VOLTAGE FUSES: Product data and properties for information exchange
20.99 WD approved for registration as CD
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