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Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices
30.20 CD study/ballot initiated
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 6: Visual Imaging devices
30.20 CD study/ballot initiated
Switching device for islanding (SDFI)
50.00 Final text received or FDIS registered for formal approval
Fully flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements
40.60 Close of voting
LED Light sources – Performance requirements
40.99 Full report circulated: DIS approved for registration as FDIS
Coupled-stress acceleration test sequence for photovoltaic modules and materials
40.99 Full report circulated: DIS approved for registration as FDIS
Concentric lay overhead electrical stranded conductors
30.60 Close of voting/ comment period
Excimer sources for germicidal purpose - Safety specifications
30.99 CD approved for registration as DIS
Measurement of ozone production from UV-C radiation sources and luminaires
20.99 WD approved for registration as CD
Germicidal equipment - Low-pressure mercury UV radiation sources for germicidal purpose - Safety specifications
20.99 WD approved for registration as CD
Electrical safety of Snow melting photovoltaic (Snow PV) module - Requirements for construction and testing
40.99 Full report circulated: DIS approved for registration as FDIS
Visual comfort of display terminals - Part 1: Introduction
40.99 Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
40.00 DIS registered
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
30.60 Close of voting/ comment period
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
30.99 CD approved for registration as DIS
Quantum Interconnect – Part 1: Introduction and roadmap for standardization
50.00 Final text received or FDIS registered for formal approval
High-level test description table for development of production test programs
40.99 Full report circulated: DIS approved for registration as FDIS
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