DPS
Drejtoria e Përgjithshme e Standardizimit
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

Projects

Use the form below to find the searched projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”.

Semiconductor devices - Detection modules of autonomous land vehicle - Part 4: Testing methods of performance for millimeter-wave radar

10.60 Close of voting

TC 47 more

Semiconductor devices - Detection modules of autonomous land vehicle - Part 5: Testing methods of performance for ultrasonic modules

10.60 Close of voting

TC 47 more

Semiconductor devices - Detection modules of autonomous land vehicle - Part 6: Testing methods of performance for visual imaging modules

10.60 Close of voting

TC 47 more

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process

10.60 Close of voting

TC 47 more

Reliability evaluation methods for vibration energy harvesters - Part 2: Temperature and humidity

10.20 New project ballot initiated

TC 47 more

Semiconductor devices - semiconductor devices for IOT system - part 2: test method of semiconductor photon sources incorporating human factors for wearable equipment

10.20 New project ballot initiated

TC 47 more

Integrated Circuits – Electronic fuses for low voltage automotive power distribution networks

00.99 Approval to ballot proposal for new project

TC 47/SC 47A more

integrated circuits – Three Dimensional Integrated Circuits Part x: In-line thermal measurement of warpage

00.00 Proposal for new project received

TC 47/SC 47A more

Integrated circuits – Part X: Standardization Roadmap for Fan-Out Packages

00.00 Proposal for new project received

TC 47/SC 47A more

IEC60191-6-23 Ed.1.0 :Standardization roadmap for fan-out packages

00.99 Approval to ballot proposal for new project

TC 47/SC 47D more

Model creation method using a measurement data of semiconductor device

00.00 Proposal for new project received

TC 47/SC 47D more

IEC 6xxxxx-2: Required Specifications of package substrates for advanced semiconductor packaging - Part 2 Failure Analysis Methods for Current Induced Quality Test of Package Substrates

00.00 Proposal for new project received

TC 47/SC 47D more

IEC 6xxxxx-3: Required Specifications of package substrates for advanced semiconductor packaging - Part 3 Standard Substrates structure for Current Induced Quality Test of Package Substrates

00.00 Proposal for new project received

TC 47/SC 47D more

IECxxxxx: Date Code of individual electronic components

00.99 Approval to ballot proposal for new project

TC 47/SC 47D more

Future IEC TR 60191-7-2 Ed.1: Thermal conductivity measurement method and samples for electronic components

00.00 Proposal for new project received

TC 47/SC 47D more

Thermal standardization on semiconductor packages – Part 7: Background and glossary of Thermal Simulation and Compact Thermal Models on Semiconductor Packaging

00.00 Proposal for new project received

TC 47/SC 47D more

Test method of sound variation detection sensors for fire detection

00.99 Approval to ballot proposal for new project

TC 47/SC 47E more

Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

10.20 New project ballot initiated

TC 47/SC 47F more