DPS
Drejtoria e Përgjithshme e Standardizimit
Tel/Cel: +355 4 222 62 55
E-mail: info@dps.gov.al
Adresa: Rr.: "Reshit Collaku", (pranë ILDKPKI, kati VI), Kutia Postare 98, Tiranë - Shqipëri
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Projects

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Semiconductor devices - Detection modules of autonomous land vehicle - Part 4: Testing methods of performance for millimeter-wave radar

10.60 Close of voting

TC 47 më tepër

Semiconductor devices - Detection modules of autonomous land vehicle - Part 5: Testing methods of performance for ultrasonic modules

10.60 Close of voting

TC 47 më tepër

Semiconductor devices - Detection modules of autonomous land vehicle - Part 6: Testing methods of performance for visual imaging modules

10.60 Close of voting

TC 47 më tepër

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process

10.60 Close of voting

TC 47 më tepër

Reliability evaluation methods for vibration energy harvesters - Part 2: Temperature and humidity

10.20 New project ballot initiated

TC 47 më tepër

Semiconductor devices - semiconductor devices for IOT system - part 2: test method of semiconductor photon sources incorporating human factors for wearable equipment

10.20 New project ballot initiated

TC 47 më tepër

Integrated Circuits – Electronic fuses for low voltage automotive power distribution networks

00.99 Approval to ballot proposal for new project

TC 47/SC 47A më tepër

integrated circuits – Three Dimensional Integrated Circuits Part x: In-line thermal measurement of warpage

00.00 Proposal for new project received

TC 47/SC 47A më tepër

Integrated circuits – Part X: Standardization Roadmap for Fan-Out Packages

00.00 Proposal for new project received

TC 47/SC 47A më tepër

IEC60191-6-23 Ed.1.0 :Standardization roadmap for fan-out packages

00.99 Approval to ballot proposal for new project

TC 47/SC 47D më tepër

Model creation method using a measurement data of semiconductor device

00.00 Proposal for new project received

TC 47/SC 47D më tepër

IEC 6xxxxx-2: Required Specifications of package substrates for advanced semiconductor packaging - Part 2 Failure Analysis Methods for Current Induced Quality Test of Package Substrates

00.00 Proposal for new project received

TC 47/SC 47D më tepër

IEC 6xxxxx-3: Required Specifications of package substrates for advanced semiconductor packaging - Part 3 Standard Substrates structure for Current Induced Quality Test of Package Substrates

00.00 Proposal for new project received

TC 47/SC 47D më tepër

IECxxxxx: Date Code of individual electronic components

00.99 Approval to ballot proposal for new project

TC 47/SC 47D më tepër

Future IEC TR 60191-7-2 Ed.1: Thermal conductivity measurement method and samples for electronic components

00.00 Proposal for new project received

TC 47/SC 47D më tepër

Thermal standardization on semiconductor packages – Part 7: Background and glossary of Thermal Simulation and Compact Thermal Models on Semiconductor Packaging

00.00 Proposal for new project received

TC 47/SC 47D më tepër

Test method of sound variation detection sensors for fire detection

00.99 Approval to ballot proposal for new project

TC 47/SC 47E më tepër

Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

10.20 New project ballot initiated

TC 47/SC 47F më tepër