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IEC 60749-23:2004/AMD1:2011 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
27 jan 2011

General information

99.60     9 dhj 2025

IEC

TC 47

International Standard

31.080.01  

anglisht   frëngjisht   spanjisht  

Buying

Revised

Language in which you want to receive the document.

Scope

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-23:2004 ED1

NOW

WITHDRAWN
IEC 60749-23:2004/AMD1:2011 ED1
99.60 Withdrawal effective
9 dhj 2025

REVISED BY

PUBLISHED
IEC 60749-23:2025 ED2