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IEC 60749-23 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

General information

Current stage: 40.20 Effective date: 22 nën 2024

Next stage: PRVC Next stage date: 14 shk 2025

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Scope

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-23:2004 ED1

PUBLISHED
IEC 60749-23:2004/AMD1:2011 ED1

NOW

IN_DEVELOPMENT
IEC 60749-23 ED2
40.20 DIS ballot initiated: 12 weeks
22 nën 2024

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