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IEC 60749-23 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

General information

40.20     Nov 22, 2024

PRVC    Feb 14, 2025

IEC

TC 47

International Standard

31.080.01  

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-23:2004 ED1

PUBLISHED
IEC 60749-23:2004/AMD1:2011 ED1

NOW

IN_DEVELOPMENT
IEC 60749-23 ED2
40.20 DIS ballot initiated: 12 weeks
Nov 22, 2024

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