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IEC 60749-23:2004/AMD1:2011 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Jan 27, 2011

General information

99.60     Dec 9, 2025

IEC

TC 47

International Standard

31.080.01  

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IEC 60749-23:2004 ED1

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IEC 60749-23:2004/AMD1:2011 ED1
99.60 Withdrawal effective
Dec 9, 2025

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IEC 60749-23:2025 ED2