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SSH IEC 60748-11-1:1992

Pajisje gjysëmpërçuese - Qarqet e integruara - Pjesa 11-1: Kontrolli vizual i brendshme për qarqet e integruara me gjysëmpërçues me përjashtim të qarqeve hibride

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
16 nën 2016

General information

60.60     11 korr 2016

DPS

DPS/KT 7

International Standard

31.200  

anglisht  

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Scope

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Life cycle

NOW

PUBLISHED
SSH IEC 60748-11-1:1992
60.60 Standard published
11 korr 2016

Related project

Adopted from IEC 60748-11-1:1992 ED1 IDENTICAL

Adopted from IEC 60748-11-1 Ed. 1.0 b