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IEC 60748-11-1:1992 ED1

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
1 pri 1992

General information

60.60     15 maj 1992

IEC

TC 47/SC 47A

International Standard

31.200  

anglisht   frëngjisht   rusisht  

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Scope

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Life cycle

NOW

PUBLISHED
IEC 60748-11-1:1992 ED1
60.60 Standard published
15 maj 1992

REVISED BY

ABANDON
IEC 60748-11-1 ED2

National adoptions

Pajisje gjysëmpërçuese - Qarqet e integruara - Pjesa 11-1: Kontrolli vizual i brendshme për qarqet e integruara me gjysëmpërçues me përjashtim të qarqeve hibride

60.60 Standard published

DPS/KT 7 më tepër