IEC 60748-11-1:1992 ED1

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Publication date: Apr 1, 1992

General information

Current stage: 60.60 Effective date: May 15, 1992

Originator: IEC

Owner: TC 47/SC 47A

Type: International Standard

ICS: 31.2

Languages: English French Russian

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Status: Published

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Scope

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Life cycle

NOW

PUBLISHED
IEC 60748-11-1:1992 ED1
60.60 Standard published
May 15, 1992

REVISED BY

ABANDON
IEC 60748-11-1 ED2

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