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IEC 60748-11-1:1992 ED1

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Apr 1, 1992

General information

60.60     May 15, 1992

IEC

TC 47/SC 47A

International Standard

31.200  

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Scope

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Life cycle

NOW

PUBLISHED
IEC 60748-11-1:1992 ED1
60.60 Standard published
May 15, 1992

REVISED BY

ABANDON
IEC 60748-11-1 ED2

National adoptions

SSH IEC 60748-11-1:1992  
DPS

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

60.60 Standard published

DPS/KT 7 more