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SSH IEC 60748-11-1:1992

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Nov 16, 2016

General information

60.60     Jul 11, 2016

DPS

DPS/KT 7

International Standard

31.200  

English  

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Scope

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

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PUBLISHED
SSH IEC 60748-11-1:1992
60.60 Standard published
Jul 11, 2016

Related project

Adopted from IEC 60748-11-1:1992 ED1 IDENTICAL

Adopted from IEC 60748-11-1 Ed. 1.0 b