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Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
30.99 CD approved for registration as DIS
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
60.00 Standard under publication
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
30.60 Close of voting/ comment period
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols
40.99 Full report circulated: DIS approved for registration as FDIS
Nuclear facilities - Electrical equipment important to safety - Qualification
30.99 CD approved for registration as DIS
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
30.60 Close of voting/ comment period
Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay
20.99 WD approved for registration as CD
Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests
30.60 Close of voting/ comment period
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
30.60 Close of voting/ comment period
Optical fibres - Part 1-52: Measurement methods and test procedures - Change of temperature tests
30.60 Close of voting/ comment period
Optical fibres - Part 1-53: Measurement methods and test procedures - Water immersion tests
30.60 Close of voting/ comment period
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