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Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
40.99 Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
50.99 FDIS or proof approved for publication
Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
60.00 Standard under publication
Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
20.99 WD approved for registration as CD
Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
20.99 WD approved for registration as CD
Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
20.99 WD approved for registration as CD
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
40.00 DIS registered
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
40.00 DIS registered
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols
50.00 Final text received or FDIS registered for formal approval
Nuclear facilities - Electrical equipment important to safety - Qualification
30.99 CD approved for registration as DIS
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
40.00 DIS registered
Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay
20.99 WD approved for registration as CD
Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests
40.00 DIS registered
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
40.00 DIS registered
Optical fibres - Part 1-52: Measurement methods and test procedures - Change of temperature tests
40.00 DIS registered
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