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General requirements for residual current operated protective devices for DC system
60.60 Standard published
Low-voltage switchgear and controlgear - Fire risk analysis and risk reduction measures
60.60 Standard published
Secondary cells and batteries containing alkaline or other non-acid electrolytes - Safety requirements for secondary lithium cells and batteries for use in electrical energy storage systems
60.60 Standard published
Corrigendum 1 - Secondary cells and batteries containing alkaline or other non-acid electrolytes - Safety requirements for secondary lithium cells and batteries for use in electrical energy storage systems
60.60 Standard published
Secondary cells and batteries containing alkaline or other non-acid electrolytes - Safety requirements for secondary lithium batteries for use in road vehicles not for the propulsion
60.60 Standard published
Switchgear and controlgear and their assemblies for low voltage - Environmental aspects
60.60 Standard published
Electric energy supply networks - General aspects and methods for the maintenance of installations and equipment
60.60 Standard published
Adjusted volume calculation for refrigerating appliances
60.60 Standard published
Graphical symbols for diagrams - Guidance on design for standardization in IEC 60617
60.60 Standard published
Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
60.60 Standard published
Amendment 1 - Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
60.60 Standard published
Low-voltage docking connectors for removable energy storage units
60.60 Standard published
Electrical installations for lighting and beaconing of aerodromes - Connecting devices - General requirements and tests
60.60 Standard published
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
60.60 Standard published
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
60.60 Standard published
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
60.60 Standard published
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
60.60 Standard published
Industrial-process measurement, control and automation - Framework for functional safety and security
60.60 Standard published
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