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Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
30.60 Close of voting/ comment period
Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array
30.20 CD study/ballot initiated
Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
40.60 Close of voting
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
40.60 Close of voting
Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
50.99 FDIS or proof approved for publication
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
60.00 Standard under publication
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
30.99 CD approved for registration as DIS
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
60.00 Standard under publication
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
30.60 Close of voting/ comment period
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols
40.99 Full report circulated: DIS approved for registration as FDIS
Nuclear facilities - Electrical equipment important to safety - Qualification
30.99 CD approved for registration as DIS
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry
20.99 WD approved for registration as CD
Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss
30.60 Close of voting/ comment period
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