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ISO 17915:2018

Optics and photonics — Measurement method of semiconductor lasers for sensing
25 maj 2018

General information

90.93     27 sht 2023

ISO

ISO/TC 172/SC 9

International Standard

31.260  

anglisht  

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Scope

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO/TS 17915:2013

NOW

PUBLISHED
ISO 17915:2018
90.93 Standard confirmed
27 sht 2023