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ISO/TS 17915:2013

Optics and photonics — Measurement method of semiconductor lasers for sensing
25 qer 2013
95.99 Withdrawal of Standard   25 maj 2018

General information

95.99     25 maj 2018

ISO

ISO/TC 172/SC 9

Technical Specification

31.260  

anglisht  

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Scope

ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.

Life cycle

NOW

WITHDRAWN
ISO/TS 17915:2013
95.99 Withdrawal of Standard
25 maj 2018

REVISED BY

PUBLISHED
ISO 17915:2018