ISO 17915:2018

Optics and photonics — Measurement method of semiconductor lasers for sensing

Publication date: May 25, 2018

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Current stage: 90.93 Effective date: Sep 27, 2023

Originator: ISO

Owner: ISO/TC 172/SC 9

Type: International Standard

ICS: 31.260

Languages: English

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Status: Published

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This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

ISO 17915:2018

Optics and photonics — Measurement method of semiconductor lasers for sensing

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