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ISO 19668:2017

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
14 gush 2017

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90.60     3 dhj 2022

ISO

ISO/TC 201/SC 7

International Standard

71.040.40  

anglisht  

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Scope

ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.

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ISO 19668:2017
90.60 Close of review
3 dhj 2022