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ISO 17470:2014

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
6 jan 2014

General information

90.60     3 sht 2024

ISO

ISO/TC 202/SC 2

International Standard

71.040.99  

anglisht  

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Publikuar

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Scope

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 17470:2004

NOW

PUBLISHED
ISO 17470:2014
90.60 Close of review
3 sht 2024

National adoptions

SSH ISO 17470:2014  
DPS

Analiza mikrobiale - Mikroanaliza me sondë elektronike - Udhëzime për analiza të përpikta cilësore me anë të spektrometrisë te rezeve X shpërndarë në gjatësi vale

60.60 Standard published

DPS/KT 233 më tepër