DPS
Drejtoria e Përgjithshme e Standardizimit
0 Produkte
Llogaria ime
E-albania
Tel/Cel: +355 4 222 62 55
E-mail: info@dps.gov.al
Adresa: Rr.: "Reshit Collaku", (pranë ILDKPKI, kati VI), Kutia Postare 98, Tiranë - Shqipëri
Main menu

ISO 17470:2014

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
6 jan 2014

General information

90.93     6 qer 2019

ISO

ISO/TC 202/SC 2

International Standard

71.040.99  

anglisht  

Buying

Publikuar

Language in which you want to receive the document.

Scope

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Life cycle

PREVIOUSLY

Revises
ISO 17470:2004

NOW

PUBLISHED
ISO 17470:2014
90.93 Standard confirmed
6 qer 2019

National adoptions

SSH ISO 17470:2014  
DPS

Analiza mikrobiale - Mikroanaliza me sondë elektronike - Udhëzime për analiza të përpikta cilësore me anë të spektrometrisë te rezeve X shpërndarë në gjatësi vale

60.60 Standard published

DPS/KT 233 më tepër

Preview

Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.

Login